Dlabáček, Zdeněk - Gemperle, Antonín - Gemperlová, Juliana
Improved design of a double tilt side entry straining stage for TEM.
EMC 2004. Antverpy: Belgian Society for Microscopy, 2004, s. 417-417.
[European Microscopy Congress (EMC) 2004 /13./. Antverpy (BE), 22.08.2004-27.08.2004]
http://hdl.handle.net/11104/0011492