Chmelíčková, Hana - Lapšanská, Hana - Čtvrtlík, Radim
Pulsed Nd:YAG laser beam profile analyse.
Optical measurement systems for industrial inspection IV. Washington: SPIE, 2005 - (Osten, W.; Gorecki, C.; Novak, E.), s. 1014-1021. Proceedings of SPIE, 5856. ISBN 0-8194-5856-2. ISSN 0277-786X.
[Optical measurement systems for industrial inspection IV. Munich (DE), 13.06.2005-17.06.2005]
Grant CEP: GA AV ČR(CZ) IBS1010353
http://hdl.handle.net/11104/0114774