0536755 - ÚPT 2021 RIV US eng J - Článek v odborném periodiku
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Very Low Energy Electron Transmission Spectroscopy of 2D Materials.
Microscopy and Microanalysis. Roč. 26, S2 (2020), s. 2636-2638. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: spectroscopy * very low energy electron transmission * 2D materials
Obor OECD: Electrical and electronic engineering
Impakt faktor: 4.127, rok: 2020 ; AIS: 0.968, rok: 2020
Způsob publikování: Open access
Web výsledku:
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/very-low-energy-electron-transmission-spectroscopy-of-2d-materials/2F6DF5F745E2CCA1AFA45F451D68BD41DOI: https://doi.org/10.1017/S1431927620022278

Detailed knowledge of mechanisms of electron scattering and its practical consequences for very low energies are of prime importance for not only measurement techniques but also for development of newmaterials for electronic devices of the next generation. Low thickness of 2D materials motivated us to develop unique device analyzing samples via transmitted electrons in a standard microscopic regime and also via time-of-flight (ToF) spectroscopic method.
Trvalý link: http://hdl.handle.net/11104/0314644