BRDF Interpolation using Anisotropic Stencils

0457068 - ÚTIA 2017 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Vávra, Radomír - Filip, Jiří
BRDF Interpolation using Anisotropic Stencils.
IS&T International Symposium on Electronic Imaging 2016. Springfield: Society for Imaging Science and Technology, 2016 - (Imai, F.; Ortiz Segovia, M.; Urban, P.), MMRMA-356.1-MMRMA-356.6. ISSN 2470-1173.
[IS&T International Symposium on Electronic Imaging 2016, Measuring, Modeling, and Reproducing Material Appearance 2016. San Francisco (US), 14.2.2016-18.2.2016]
Grant CEP: GA ČR(CZ) GA14-02652S
Institucionální podpora: RVO:67985556
Klíčová slova: BRDF * stencil * anisotropic * interpolation
Kód oboru RIV: BD - Teorie informace
http://library.utia.cas.cz/separaty/2016/RO/vavra-0457068.pdf

Fast and reliable measurement of material appearance is crucial for many applications ranging from virtual prototyping to visual quality control. The most common appearance representation is BRDF capturing illumination- and viewing-dependent reflectance. One of the approaches to rapid BRDF measurement captures its subspace, using so called slices, by continuous movements of a light and camera in azimuthal directions, while their elevations remain fixed. This records set of slices in the BRDF space while remaining data are unknown. We present a novel approach to BRDF reconstruction based on a concept of anisotropic stencils interpolating values along predicted locations of anisotropic highlights. Our method marks an improvement over the original linear interpolation method, and thus we ascertain it to be a promising variant of interpolation from such sparse yet very effective measurements.
Trvalý link: http://hdl.handle.net/11104/0258929