Imaging three-dimensional surface objects with submolecular resolution by atomic force microscopy

0451941 - FZÚ 2016 RIV US eng J - Článek v odborném periodiku
Moreno, C. - Stetsovych, Oleksandr - Shimizu, T.K. - Custance, O.
Imaging three-dimensional surface objects with submolecular resolution by atomic force microscopy.
Nano Letters. Roč. 15, č. 4 (2015), s. 2257-2262. ISSN 1530-6984. E-ISSN 1530-6992
Institucionální podpora: RVO:68378271
Klíčová slova: noncontact atomic force microscopy (NC-AFM) * submolecular resolution * three-dimensional dynamic force spectroscopy * high-resolution imaging
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 13.779, rok: 2015

Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution.
Trvalý link: http://hdl.handle.net/11104/0253003