0434071 - ÚPT 2015 RIV PL eng C - Konferenční příspěvek (zahraniční konf.)
Frank, Luděk - Konvalina, Ivo - Mikmeková, Šárka
Scanning Electron Microscopy with biased samples.
EM2014. 15th International Conference on Electron Microscopy. Kraków: Wydawnictwo Naukove Akapit, 2014, s. 76-77. ISBN 978-83-63663-48-3.
[EM 2014. International Conference on Electron Microscopy /15./. Kraków (PL), 15.09.2014-18.09.2014]
Grant CEP: GA MŠMT(CZ) LO1212
Institucionální podpora: RVO:68081731
Klíčová slova: SEM * STEM * low energy electrons * graphene
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

The arrangement of the scanning electron microscope with the sample biased to a high negative potential is discussed from the point of view of detection of signal electrons both in reflected and transmitted modes.
Trvalý link: http://hdl.handle.net/11104/0238215