Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass

0368047 - ÚFE 2012 RIV US eng J - Článek v odborném periodiku
Stepanov, B. - Ren, J. - Wágner, T. - Lorinčík, Jan - Frumar, M. - Churbanov, M. - Chigirinsky, Y.
Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass.
Journal of the American Ceramic Society. Roč. 94, č. 7 (2011), 1986-1988. ISSN 0002-7820. E-ISSN 1551-2916
Výzkumný záměr: CEZ:AV0Z20670512
Klíčová slova: Solid state diffusion * Secondary Ion Mass Spectrometry * Tellurite glass
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 2.272, rok: 2011

Copper doped multi-component tellurite glasses were prepared by solid state electric field assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc-like solution of the second Fick’s law, which assumes that both Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabrication of copper doped planar waveguides based on the tellurite glasses.
Trvalý link: http://hdl.handle.net/11104/0202518