Počet záznamů: 1  

Multiple pulse nanosecond laser induced damage threshold on AR coated YAG crystals

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    0542064 - FZÚ 2022 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
    Vanda, Jan - Muresan, Mihai-George - Čech, Pavel - Hanuš, Martin - Lucianetti, Antonio - Rostohar, Danijela - Mocek, Tomáš - Uxa, Š. - Škoda, V.
    Multiple pulse nanosecond laser induced damage threshold on AR coated YAG crystals.
    Laser-Induced Damage in Optical Materials. Bellingham: SPIE, 2018 - (Carr, C.; Exarhos, G.; Soileau, M.), s. 1-9, č. článku 108050F. Proceedings of SPIE, 10805. ISBN 978-1-510-62194-7. ISSN 0277-786X.
    [Annual Laser Damage Symposium /50./. Boulder (US), 23.09.2018-26.09.2018]
    Grant CEP: GA MŠk EF15_006/0000674; GA MŠk LO1602; GA MŠk LM2015086; GA TA ČR TH02010579
    GRANT EU: European Commission(XE) 739573 - HiLASE CoE
    Grant ostatní:OP VVV - HiLASE-CoE(XE) CZ.02.1.01/0.0/0.0/15_006/0000674
    Institucionální podpora: RVO:68378271
    Klíčová slova: YAG lasers * crystals * coatings * laser crystals * laser damage threshold * laser induced damage * thin films
    Kód oboru RIV: BH - Optika, masery a lasery
    Obor OECD: Optics (including laser optics and quantum optics)
    https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10805/2500197/Multiple-pulse-nanosecond-laser-induced-damage-threshold-on-AR-coated/10.1117/12.2500197.short?SSO=1

    Yttrium aluminum garnet (YAG) crystals are one of the most important materials for active media in solid-state laser technology. Reach for higher energies brings more stress into crystals thin film coatings field, where methods used in the past are not sufficient anymore. Laser induced damage threshold (LIDT) became a major issue in further exploitation of YAG crystals as required extraction fluencies exceed tens J·cm-2 in nanosecond regime. Consequently, improved coating techniques based on e-beam deposition were introduced in order to improve damage resistance of active media. Thin films prepared on YAG crystals either by reactive or ion-assisted e-beam deposition technique were tested on LIDT by son- 1 method according to the ISO standards recommendations and results are presented in following paper.
    Trvalý link: http://hdl.handle.net/11104/0319558

     
     
Počet záznamů: 1