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3D electron diffraction: the nanocrystallography revolution

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    0522225 - FZÚ 2020 RIV US eng J - Článek v odborném periodiku
    Gemmi, M. - Mugnaioli, E. - Gorelik, T.E. - Kolb, U. - Palatinus, Lukáš - Boullay, P. - Hovmoller, S. - Abrahams, J.P.
    3D electron diffraction: the nanocrystallography revolution.
    ACS Central Science. Roč. 5, č. 8 (2019), s. 1315-1329. ISSN 2374-7943. E-ISSN 2374-7951
    Institucionální podpora: RVO:68378271
    Klíčová slova: nanocrystalline materials * electron diffraction * 3D acquisition * crystal structure
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
    Impakt faktor: 12.685, rok: 2019
    Způsob publikování: Open access

    Crystallography of nanocrystalline materials has witnessed a true revolution in the past 10 years, thanks to the introduction of protocols for 3D acquisition and analysis of electron diffraction data. This method provides single-crystal data of structure solution and refinement quality, allowing the atomic structure determination of those materials that remained hitherto unknown because of their limited crystallinity. Several experimental protocols exist, which share the common idea of sampling a sequence of diffraction patterns while the crystal is tilted around a noncrystallographic axis, namely, the goniometer axis of the transmission electron microscope sample stage. This Outlook reviews most important 3D electron diffraction applications for different kinds of samples and problematics, related with both materials and life sciences. Structure refinement including dynamical scattering is also briefly discussed.

    Trvalý link: http://hdl.handle.net/11104/0306743

     
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