Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy

0510308 - ÚPT 2020 US eng A - Abstrakt
Materna-Mikmeková, Eliška - Frank, Luděk - Konvalina, Ivo - Müllerová, Ilona - Zhang, T. - Asefa, T.
Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 500-501. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
Grant CEP: GA TA ČR(CZ) TN01000008; GA TA ČR TG03010046
Institucionální podpora: RVO:68081731
Klíčová slova: ultra-low energy * spectroscopy * contamination mitigation strategy
Obor OECD: Nano-materials (production and properties)

Perhaps the most straightforward expectation related with ultra-low energy microscopy/spectroscopy is
the low penetration of electrons into the samples. In general, low energy electrons cause more intense
contamination than high energy electrons, which can be explained by diminution of the interaction
volume of electrons inside the samples and increased yield of secondary electrons. Naturally, for a true
“surface” study, the sample has to be perfectly clean and an in-situ cleaning method should be applied
on the sample.
Trvalý link: http://hdl.handle.net/11104/0300817