Very low energy electron transmission spectromicroscopy

0494360 - ÚPT 2019 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very low energy electron transmission spectromicroscopy.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
Obor OECD: Electrical and electronic engineering

For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been
developed at the Institute of Scientific Instruments (ISI), with several commercially available SEMs adapted with a cathode lens for SLEEM use, as well as a dedicated self-built UHVSLEEM setup.
For a better understanding of contrast formation at low energies, especially at very low energies below 50 eV, where the local density of states plays an important role, more general knowledge about the interaction of (very) low energy electrons with solids is required. This will be achieved using a newly developed ultra-high vacuum (UHV SLEEM) setup which includes several enhancements compared to other available machines. Data processing is presented in, and processed data will be further used and tested with the Monte Carlosimulation package BRUCE, which is being developed by Werner et al. at TU Vienna.
Trvalý link: http://hdl.handle.net/11104/0287590