Počet záznamů: 1  

Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl

  1. 1.
    0481772 - FZU-D 2018 RIV US eng J - Článek v odborném periodiku
    Kopeček, Jaromír - Jurek, Karel - Kopecký, Vít - Klimša, Ladislav - Seiner, Hanuš - Sedlák, Petr - Landa, Michal - Dluhoš, J. - Petrenec, M. - Hladík, L. - Doupal, A. - Heczko, Oleg
    Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl.
    Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336. ISSN 1431-9276
    Grant CEP: GA ČR(CZ) GA14-03044S
    Institucionální podpora: RVO:68378271 ; RVO:61388998
    Klíčová slova: scanning electron microscope * SEM * focused ion beam * FIB * xenon plasma focused ion beam * dual beam * shape memory alloy * SMA
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
    Impakt faktor: 1.877, rok: 2014

    The presented article reviews the first experiences with the xenon plasma focused ion beam (FIB) in the scanning electron microscope (SEM) applied on the investigations of shape memory alloys (SMAs). The SMA are the focus of investigation in our department for many years and these investigated alloys are examples of material prepared by novel spark plasma sintering method (NiTi) and traditional metallurgical method (CoNiAl). Thus apart of basic characterization it also facilitates the comparison between two different methods of preparation.
    Trvalý link: http://hdl.handle.net/11104/0277259