0475557 - ÚMCH 2018 RIV CH eng J - Článek v odborném periodiku
Todorov, V. - Lozanova, V. - Knotek, P. - Černošková, E. - Vlček, Milan
Microstructure and ellipsometric modelling of the optical properties of very thin silver films for application in plasmonics.
Thin Solid Films. Roč. 628, 30 April (2017), s. 22-30. ISSN 0040-6090. E-ISSN 1879-2731
Institucionální podpora: RVO:61389013
Klíčová slova: thin films * silver * spectral ellipsometry
Obor OECD: Inorganic and nuclear chemistry
Impakt faktor: 1.939, rok: 2017

The present paper reports results for the optical properties of the nanocrystalline silver thin films in attempt to understand the effects of the particle size. The microstructure of the films was probed by scanning electronmicroscopy, Atomic Force microscopy (AFM) and X-ray diffraction (XRD). The size of the crystallites/grains calculated fromthe XRDmeasurements by the Debye-Scherrer formula is in a good agreementwith the AFMresults. The optical propertieswere determined fromspectral ellipsometric measurements.
Trvalý link: http://hdl.handle.net/11104/0274151