Počet záznamů: 1  

Scanning thermal microscopy of thermoelectric nanostructures

  1. 1.
    0470064 - FZU-D 2017 RIV US eng J - Článek v odborném periodiku
    Vaniš, Jan - Zelinka, Jiří - Zeipl, Radek - Jelínek, Miroslav - Kocourek, Tomáš - Remsa, Jan - Navrátil, Jiří
    Scanning thermal microscopy of thermoelectric nanostructures.
    Journal of Electronic Materials. Roč. 45, č. 3 (2016), s. 1734-1739. ISSN 0361-5235
    Grant CEP: GA ČR(CZ) GA15-05864S; GA ČR(CZ) GA13-33056S
    Institucionální podpora: RVO:68378271 ; RVO:61389013
    Klíčová slova: thermoelectric layer * scanning thermal microscopy * pulsed laser deposition * laser deposition * secondary ion mass spectrometry
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus; CA - Anorganická chemie (UMCH-V)
    Impakt faktor: 1.579, rok: 2016

    We present the development and results of a new simple method for thermal conductivity characterization of thin films and thermoelectric structures using a scanning thermal microscope in pulsed current mode. The presented method does not allow measurement of absolute thermal conductivity of the studied system, but only relative to the Si substrate. We present the results of the method on the Si substrate/layer step boundary. The nano-layers of different thickness and different materials were prepared for the experiments by the pulsed laser deposition from hot-pressed targets.
    Trvalý link: http://hdl.handle.net/11104/0267800