Scanning transmission microscopy at very low energies

0460206 - ÚPT 2017 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Müllerová, Ilona - Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk
Scanning transmission microscopy at very low energies.
Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 40-41. ISBN 978-80-87441-17-6.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
Grant CEP: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institucionální podpora: RVO:68081731
Klíčová slova: electron microscopy * SEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
http://www.trends.isibrno.cz/

To operate down to units of eV with a small primary spot size, a cathode lens with a biased specimen was introduced into the SEM. The reflected signal, accelerated secondary and backscattered electrons, is collected by detectors situated above the specimen.
When we insert a detector below the specimen, the transmitted electron signal can also be used for imaging down to zero energy. Fig. 1 also shows an example of the simulated signal trajectories of electrons that impact on the detector of reflected electrons, based on an Yttrium Aluminium Garnet (YAG) crystal, and trajectories of electrons transmitted through the specimen and incident on a semiconductor detector based on the PIN structure.
Trvalý link: http://hdl.handle.net/11104/0260338