0439500 - FZÚ 2015 RIV CH eng J - Článek v odborném periodiku
Dalimier, E. - Oks, E. - Renner, Oldřich
Review of Langmuir-wave-caused dips and charge-exchange-caused dips in spectral lines from plasmas and their applications.
Atoms. Roč. 2, č. 2 (2014), s. 178-194. ISSN 2218-2004. E-ISSN 2218-2004
Grant ostatní: AVČR(CZ) M100101208
Institucionální podpora: RVO:68378271
Klíčová slova: Laser-matter interaction * spectral line profiles * Langmuir waves * plasma electron density * charge exchange rates
Kód oboru RIV: BL - Fyzika plazmatu a výboje v plynech
DOI: https://doi.org/10.3390/atoms2020178

We review studies of two kinds of dips in spectral line profiles emitted by plasmas: Langmuir-wave-caused dips (L-dips) and charge-exchange-caused dips (X-dips). L-dips are a multi-frequency resonance phenomenon caused by a singlefrequency (monochromatic) electric field. X-dips are due to charge exchange at anticrossings of terms of a diatomic quasi-molecule, whose nuclei have different charges. As for practical applications, observations of L-dips constitute a very accurate method to measure the electron density in plasmas and allow measuring the amplitude of the electric field of Langmuir waves. Observations of X-dips provide an opportunity to determine rate coefficient of charge exchange between multi-charged ions. This information is important for magnetic fusion in Tokamaks, for population inversion in the soft x-ray and VUV ranges, for ion storage devices, as well as for astrophysics (e.g., for the solar plasma and for determining the physical state of planetary nebulae).
Trvalý link: http://hdl.handle.net/11104/0242777