0422680 - ÚPT 2014 CZ eng K - Konferenční příspěvek (tuzemská konf.)
Pokorná, Zuzana
Reflectivity of very low energy electrons from polycrystalline metal samples.
Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, s. 9.
[Mikroskopie 2013. Lednice (CZ), 13.05.2013-14.05.2013]
Grant CEP: GA TA ČR TE01020118; GA ČR GAP108/11/2270
Institucionální podpora: RVO:68081731
Klíčová slova: eflectivity * very low energy electros * polyctystalline metal samples
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

The reflectivity of very low energy electrons from the surfaces of both single crystal and polycrystalline aluminium and copper was measured in a Scanning Low Energy Electron Microscope in Ultra High Vacuum conditions. This metod alows for an ultra high resolution of the order of units of nanometers even at the lowest electron energies.
Trvalý link: http://hdl.handle.net/11104/0229233