Proton microscopy on 3 MV Tandetron Accelerator at NPI Řež

0389336 - ÚJF 2013 CZ eng A - Abstrakt
Malinský, Petr - Havránek, Vladimír - Peřina, Vratislav - Voseček, Václav - Kranda, Karel
Proton microscopy on 3 MV Tandetron Accelerator at NPI Řež.
Mikroskopie 2012. Praha 4: Československá mikroskopická společnost, 2012. s. 16-16.
[Mikroskopie 2012. 17.04.2012-18.04.2012, Bratislava]
Grant CEP: GA ČR GA104/09/1269; GA MŠMT(CZ) LC06041
Institucionální podpora: RVO:61389005
Klíčová slova: Tandetron * microbeam
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače

Since its beginnings in sixties, the use of energetic ions (in MeV range) for analysis and modification of materials become a mature technique [1]. Several tens of such systems are nowadays installed worldwide [2]. The resolution of the ion micro-beams reached sub micrometer with still high enough beam current for quantitative analysis by μ-PIXE and μ-RBS and related Ion Beam Analysis. From 2009 an ion microbeam system based on Oxford Microbeams Ltd. [3] components is installed on 3MV Tandetron 4130MC HVEE accelerator at NPI ASCR in Řež. The resolution of 1 μm in high current mode and 0.5 μm has been achieved for 2MeV proton beam. Also focusing of other ions as C4+, O5+ and Si6+ with the energies around 10 MeV was demonstrated with the resolution of 2-3 μm. Since then, the Řež ion microprobe has been used in various interdisciplinary research projects form analyzing the metal contents in single neurons to identifying the origin of ancient Chinese ceramics shreds found in Angkor Thom. Technical parameters and examples of application are presented.
Trvalý link: http://hdl.handle.net/11104/0218224