0386105 - ÚPT 2013 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Knápek, A. - Brüstlová, J. - Trčka, T. - Klampár, M. - Mikmeková, Šárka
Surface examination of ultra-sharp cold field-emission cathode.
New Trends in Physics 2012. Proceedings of the conference. Brno: University of technology, 2012 - (Koktavý, P.; Brüstlová, J.), s. 51-56. ISBN 978-80-214-4594-9.
[New Trends in Physics 2012. Brno (CZ), 11.10.2012-12.10.2012]
Institucionální podpora: RVO:68081731
Klíčová slova: ultra-sharp field-emission cathode * SLEEM * DRS
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.
Trvalý link: http://hdl.handle.net/11104/0215513