Ambient analysis of trace compounds in gaseous media by SIFT-MS

0359555 - ÚFCH JH 2012 RIV GB eng J - Článek v odborném periodiku
Smith, D. - Španěl, Patrik
Ambient analysis of trace compounds in gaseous media by SIFT-MS.
Analyst. Roč. 136, č. 10 (2011), s. 2009-2032. ISSN 0003-2654. E-ISSN 1364-5528
Grant CEP: GA ČR GA202/09/0800; GA ČR GA203/09/0256
Výzkumný záměr: CEZ:AV0Z40400503
Klíčová slova: ion-flow tube * mass spectrometry * SIFT-MS
Kód oboru RIV: CF - Fyzikální chemie a teoretická chemie
Impakt faktor: 4.230, rok: 2011

The topic of ambient gas analysis has been rapidly developed in the last few years with the evolution of the exciting new techniques such as DESI, DART and EESI. The essential feature of all is that analysis of trace gases can be accomplished either in the gas phase or those released from surfaces, crucially avoiding sample collection or modification. In this regard, selected ion flow tube mass spectrometry, SIFT-MS, also performs ambient analyses both accurately and rapidly. In this focused review we describe the underlying ion chemistry underpinning SIFT-MS through a discourse on the reactions of different classes of organic and inorganic molecules with H3O+, NO+ and O-2(+center dot) studied using the SIFT technique. Rate coefficients and ion products of these reactions facilitate absolute SIFT-MS analyses and can also be useful for the interpretation of data obtained by the other ambient analysis methods mentioned above.
Trvalý link: http://hdl.handle.net/11104/0197326