Oxygen-containing diatomic dications in the gas phase

0341443 - ÚFE 2010 RIV GB eng J - Článek v odborném periodiku
Fišer, J. - Franzreb, K. - Lorinčík, Jan - Williams, P.
Oxygen-containing diatomic dications in the gas phase.
European Journal of Mass Spectrometry. Roč. 15, č. 2 (2009), s. 315-324. ISSN 1469-0667
Výzkumný záměr: CEZ:AV0Z20670512
Klíčová slova: mass spectrometry
Kód oboru RIV: JB - Senzory, čidla, měření a regulace
Impakt faktor: 1.340, rok: 2009

A variety of oxygen-containing diatomic dications, XO2+ can be produced in the gas phase by prolonged high-current O-16(-) ion surface bombardment [oxygen ion beam sputtering] of a wide range of sample materials. These gas-phase species were detected by mass spectrometry at half-integer m/z values for ion flight times of the order of similar to 10(-5)s. Examples provided here include ion mass spectra of AsO2+, GaO2+, SbO2+, AgO2+, CrO2+ and BeO2+. A detailed theoretical study of the diatomic dication system BeO2+, is also presented.
Trvalý link: http://hdl.handle.net/11104/0005807