Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope

0335298 - ÚPT 2011 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Pokorná, Zuzana - Frank, Luděk
Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope.
Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 26. ISBN 978-80-254-4535-8.
[CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: scanning low energy electron microscopes * polycrystalline aluminium
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

Single crystal and polycrystalline aluminium samples were imaged in the scanning low energy electron microscopes at energies of impinging electrons ranging between 0 and 90 eV. The integrated image signal at each energy was calculated and the resulting reflectance curves were compared to electron structure calculations. The influence of vacuum conditions and cleanliness of the substrate surface are discussed.
Trvalý link: http://hdl.handle.net/11104/0179804