Počet záznamů: 1  

Doubly charged ion emission in sputtering of monocrystalline fluorides

  1. 1.
    0303940 - URE-Y 20020020 RIV NL eng J - Článek v odborném periodiku
    Lörinčík, Jan - Šroubek, Zdeněk
    Doubly charged ion emission in sputtering of monocrystalline fluorides.
    Nuclear Instruments & Methods in Physics Research Section B. Roč. 187, č. 4 (2002), s. 447-450. ISSN 0168-583X.
    [Atomic Collisions in Solids ICACS /19./. Paris, 29.07.2001-03.08.2001]
    Grant CEP: GA AV ČR IAA1067801; GA ČR GA202/99/0881
    Výzkumný záměr: CEZ:AV0Z2067918
    Klíčová slova: sputtering * molecular electronic states * secondary ion emission
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 1.158, rok: 2002

    Sputtering of monocrystalline CeF3, LaF3 (doped with Eu), CaF2, and CaCeF2 surfaces by Ar.sup.+.sup. ions with impact energies 500 - 5000 eV has been performed. The emission of Ce.sup.+.sup., Ce.sup.++.sup., La.sup.+.sup., La.sup.++.sup., Eu.sup.+.sup., Eu.sup.++.sup., Ca.sup.+.sup., Ca.sup.++.sup., and F.sup.+.sup. has been investigated by a quadrupole SIMS.
    Trvalý link: http://hdl.handle.net/11104/0114084