0303624 - URE-Y 20000067 RIV US eng J - Článek v odborném periodiku
Czajka, R. - Horák, Jaromír - Lošťák, P. - Karamazov, S. - Vaniš, Jan - Walachová, Jarmila
Characterization and nanometer-scale modifications of Bi₂Te₃ surface via atomic force mircoscopy.
Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 18, May/June (2000), s. 1194-1197. ISSN 0734-2101. E-ISSN 1520-8559
Grant CEP: GA ČR GA102/97/0427
Výzkumný záměr: CEZ:AV0Z2067918
Klíčová slova: nanostructured materials * semiconductor materials * thermoelectric devices
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 1.569, rok: 2000

The Bi₂Te₃ crystal was studied by means of the atomic force miroscopy (AFM). The atomic resolution, existence of Te vacancies and existence of steps were observed on cleaved surface of Bi₂Te₃ (Te plane). The formation of nanostructures on Bi₂Te₃ is schown.
Trvalý link: http://hdl.handle.net/11104/0113812