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Advances in Imaging and Electron Physics

  1. 1.
    0205556 - UPT-D 20020106 RIV US eng M - Část monografie knihy
    Frank, Luděk
    Advances in scanning electron microscopy.
    Advances in Imaging and Electron Physics., s. 327 - 373
    Grant CEP: GA ČR GA202/99/0008
    Výzkumný záměr: CEZ:AV0Z2065902
    Klíčová slova: scanning electron microscopy * electron optics * instrumens for study of surfaces
    Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

    The monograph defines a configuration, construction and electron optical parameters of a standard scanning electron microscope and it defines and analyses new principals and approaches towards this standard. All aspects of the device are dealt with including the detection system, mechanization of the construction, vacuum and control electronics. The attention is devoted to new trends, which are: microscopy at higher pressure, microscopy byvery slow electrons and multi-channel signal detection.
    Trvalý link: http://hdl.handle.net/11104/0101169

     
     

Počet záznamů: 1