0185043 - UJF-V 20000213 RIV DE eng J - Článek v odborném periodiku
Švorčík, V. - Tichá, H. - Rybka, V. - Hnatowicz, Vladimír
Characterization of polymeric films by ellipsometry.
Journal of Materials Science Letters. Roč. 19, - (2000), s. 679-681. ISSN 0261-8028
Výzkumný záměr: CEZ:AV0Z1048901
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače
Impakt faktor: 0.496, rok: 2000

The reflection and transmission ellipsometry is used for characterization of poly(ethyleneterephtalate), polyethylene andpolystyrene thin films. The dependence of ellipsometric parameters .psí. and .DELTA. on the polarity, orientation and thickness of the film is determined. From the reflection measurement data the relative permittivity and refractive index ofpolymers is determined.
Trvalý link: http://hdl.handle.net/11104/0081465