0181480 - UFCH-W 20020149 RIV SE eng C - Konferenční příspěvek (zahraniční konf.)
Bastl, Zdeněk - Spirovová, Ilona - Pick, Štěpán
Formation of the Pd/V Interface: An Angle Resolved XPS and XAES Study.
Proceeding of the 7th European Conference on Nanometer-Scale Science and Technology. Švédsko: Malmö Kongressbyra AB, 2002, s. 1-4.
[European Conference on Nanometer-Scale Science and Technology /7./. Malmö (SE), 24.06.2002-28.06.2002]
Výzkumný záměr: CEZ:AV0Z4040901
Klíčová slova: Pd-V alloy * bimetallic interfaces * XPS and XAES
Kód oboru RIV: CF - Fyzikální chemie a teoretická chemie

The growth of Pd deposited on a V surface and formation of Pd/V interface has been studied by angle resolved X-ray photoelectron spectroscopy and X-ray induced Auger electron spectroscopy methods. The measured Pd core level shifts fit well into the trends observed for Pd deposited on early transition metals and are consistent with those calculated within the initial state approximation using a selfconsistent tight binding model.
Trvalý link: http://hdl.handle.net/11104/0078044