0162223 - UIACH-O 200041 RIV DE eng C - Konferenční příspěvek (zahraniční konf.)
Dočekal, Bohumil
Analysis of advanced materials by direct solid sampling ET AAS with Zeeman-effect background correction system.
9th Solid Sampling Spectrometry Colloquium. Merseburg, 2000, s. 14.
[Solid Sampling Spectromectry Colloquium /9./. Merseburg (DE), 11.09.2000-15.09.2000]
Grant CEP: GA ČR GA203/97/0345
Kód oboru RIV: CB - Analytická chemie, separace

Usefulness of the solid sampling technique (slurry and true solid sampling) in electrothermal atomic absorption spectrometry is demonstrated by some examples in the analysis of powdered ceramic materials and refractory metals for microelectronic application. Special attention is paid to interference effects caused by strong and structured background attenuation and to overcoming them by Zeeman-effect based compensation.
Trvalý link: http://hdl.handle.net/11104/0059542