0161452 - SLCHPL-S 20010021 RIV SIGLE CZ eng M - Část monografie knihy
Nagels, P. - Mertens, R. - Tichý, Ladislav
Structural characterization amorphous GexSe100-x by infrared and Raman spectroscopy.
Properties and Application of Amorphous Materials. Amsterdam: Kluwer Academic Publisher, 2001 - (Thorpe, M.; Tichý, L.), s. 25-34. ISBN 0-7923-6811-8
Výzkumný záměr: CEZ:AV0Z4050913
Klíčová slova: amorphous chalcogenides * raman spectroscopy * structure
Kód oboru RIV: CA - Anorganická chemie

Using Raman spectroscopy it was shown that the PECVD films have a hisber degree of in comparison to the evaporation films.
Trvalý link: http://hdl.handle.net/11104/0058799