0134642 - FZU-D 20030542 RIV NL eng J - Článek v odborném periodiku
Gedeon, O. - Zemek, Josef
Low energy and low dose electron irradiation of potassium-lime-silicate glass investigated by XPS. I. Surface composition.
Journal of Non-Crystalline Solids. Roč. 320, - (2003), s. 177-186. ISSN 0022-3093. E-ISSN 1873-4812
Grant CEP: GA ČR GA104/99/1407
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: x-ray photoelectron spectroscopy * potassium-lime-silicate glass * electron-solid interaction
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 1.563, rok: 2003

X-ray induced photoelectron spectroscopy has been used to study the influence of low-energy electron beam on the pristine potassium-lime-silicate glass surface prepared by fracturing in situ under ultrahigh vacuum.
Trvalý link: http://hdl.handle.net/11104/0032537