0134319 - FZU-D 20030215 RIV CZ eng J - Článek v odborném periodiku
Drbohlav, Ivo
Applications of the AFM in Institute of Physics.
Jemná mechanika a optika. Roč. 47, 6-7 (2002), s. 214-215. ISSN 0447-6441
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: AFM * surface structure * quantum dots * polycrystalline silicon * optoelectronic materials
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Some of the last activities of the Institute of Physics of CAS using the atomic force microscopy are described. The activities were focused namely on the study of quantum dots prepared by means of the LP-MOVPE technology and surfaces of some other materials (e.g. LiNbO₃ and polycrystalline Si) as well.
Trvalý link: http://hdl.handle.net/11104/0032225