0134102 - FZU-D 20020391 RIV CZ eng J - Článek v odborném periodiku
Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Total electron emission from metals due to the impact of highly-charged Xe ioms with energies up to MeV.
Czechoslovak Journal of Physics. Roč. 51, č. 8 (2001), s. 791-797. ISSN 0011-4626
Grant CEP: GA AV ČR IAA1010819
Výzkumný záměr: CEZ:AV0Z1010921
Klíčová slova: corpuscular diagnostic * multiply charged ions * secondary electron emission
Kód oboru RIV: BH - Optika, masery a lasery
Impakt faktor: 0.345, rok: 2001

Total electron emission from metals due to the impact of highly charged ions, .gamma., may significantly influence quantitative measurements of ion current in corpuscular diagnostic.

Trvalý link: http://hdl.handle.net/11104/0000653