0134093 - FZU-D 20020382 RIV SK eng J - Článek v odborném periodiku
Bartoněk, L. - Keprt, Jiří
Computerized evaluation optical measuring thin films by the help of Michelson`s interferometer.
Materiálové inžinierstvo - Materials Engineering. Roč. 9, č. 2 (2002), s. 27-34. ISSN 1335-0803
Grant CEP: GA MŠMT LN00A015
Výzkumný záměr: CEZ:AV0Z1010921
Klíčová slova: Michelson`s interferometer * computerized evaluation
Kód oboru RIV: BH - Optika, masery a lasery

The interferometric measurement method of a thin film optical thickness is presented in this report. This measurement is realized by Michelson`s interferometer. Interferogram of a measured sample with one half of the surface covered by a layer is digitally recorded from thr screen by CCD camera.
Trvalý link: http://hdl.handle.net/11104/0032030