Počet záznamů: 1  

Electron yield from Be-Cu induced by highly charged Xe q+ ions

  1. 1. 0133977 - FZU-D 20020265 RIV NL eng J - Článek v odborném periodiku
    Krása, Josef - Láska, Leoš - Stöckli, M. P. - Fehrenbach, C. W.
    Electron yield from Be-Cu induced by highly charged Xe q+ ions.
    Nuclear Instruments & Methods in Physics Research Section B. Roč. 196, - (2002), s. 61-67. ISSN 0168-583X
    Grant CEP: GA AV ČR IAA1010105; GA MŠk LN00A100
    Výzkumný záměr: CEZ:AV0Z1010921
    Klíčová slova: highly charged ion-induced electron emission * angle impact effect * Be-Cu
    Kód oboru RIV: BH - Optika, masery a lasery
    Impakt faktor: 1.158, rok: 2002

    The total electron yield, gamma, for emission of electrons induced by impact of Xeq+ (8óqó28) ions with kinetic energy per charge E.sub/sub./q from 5 to 150keV/q on clean Be-Cu is presented for the impact angle, é, ranging from 0o to 60o.The é-dependences are analyzed with the use of the relation, which can distinguish above- and below-surface electron emission.
    Trvalý link: http://hdl.handle.net/11104/0031924