0133868 - FZU-D 20020047 RIV GB eng J - Článek v odborném periodiku
Glinchuk, M. D. - Eliseev, E. A. - Deineka, Alexander - Jastrabík, Lubomír - Suchaneck, G. - Sandner, T. - Gerlach, G. - Hrabovský, Miroslav
Optical refraction index and polarization profile of ferroelectric thin films.
Integrated Ferroelectrics. Roč. 38, 1-4 (2001), s. 101-110. ISSN 1058-4587. E-ISSN 1607-8489
Grant CEP: GA MŠMT LN00A015; GA ČR GA202/00/1425
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: thin film * refraction index * polarization * film thickness
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 0.512, rok: 2001

Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization.
Trvalý link: http://hdl.handle.net/11104/0031819