Počet záznamů: 1  

Nondestructive investigatons of the depth profile of PZT ferroelectric films

  1. 1.
    0133692 - FZU-D 20010492 RIV GB eng J - Článek v odborném periodiku
    Deineka, Alexander - Glinchuk, M. D. - Jastrabík, Lubomír - Suchaneck, G. - Gerlach, G.
    Nondestructive investigatons of the depth profile of PZT ferroelectric films.
    Ferroelectrics. Roč. 264, - (2001), s. 151-156. ISSN 0015-0193
    Grant CEP: GA MŠk LN00A015; GA ČR GA202/00/1425
    Výzkumný záměr: CEZ:AV0Z1010914
    Klíčová slova: ferroelectric film * depth profile * interface
    Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
    Impakt faktor: 0.471, rok: 2001

    Investigations of PbZr0.235O3 (PZT) films of perovskite (pe) and pyrochlore (py) structure deposited onto Si/Si/O2/ adhesion layer/(111) Pt substrate by RF sputtering were performed with J. A. Woollam spectral ellipsometer. Experimental data were compared with theoretical predictions.
    Trvalý link: http://hdl.handle.net/11104/0031654