0133424 - FZU-D 20010276 RIV GB eng J - Článek v odborném periodiku
Bykov, I. P. - Glinchuk, M. D. - Laguta, V. V. - Slipenyuk, A. M. - Soukup, Ladislav - Jastrabík, Lubomír - Hrabovský, Miroslav
ESR integration of ferroelectric films.
Integrated Ferroelectrics. Roč. 32, - (2001), s. 159-167. ISSN 1058-4587. E-ISSN 1607-8489
Grant CEP: GA ČR GA202/00/1425
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: thin films * thick films * surface center * ESR method
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 0.512, rok: 2001

The investigation of SrTiO_{3: Ca, Cr, PbZr}0.58Ti_0.42O3 ferroelectric films on the substrate of Al_2O3 and MgO single crystals respectively was performed by ESR method. The influence of the revealed defects and impurities on the properties of the films is discussed.
Trvalý link: http://hdl.handle.net/11104/0031393