0133423 - FZU-D 20010275 RIV GB eng J - Článek v odborném periodiku
Deineka, Alexander - Glinchuk, M. D. - Jastrabík, Lubomír - Suchaneck, G. - Sandner, T. - Gerlach, G.
Ellipsometry and LIMM investigations of the interaction between PZT thin films and platinum electrodes and air.
Ferroelectrics. Roč. 254, - (2001), s. 205-211. ISSN 0015-0193. E-ISSN 1563-5112
Grant CEP: GA ČR GA202/00/1425
Výzkumný záměr: CEZ:AV0Z1010914
Klíčová slova: ferroelecric film * depth profile * interface interaction
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 0.471, rok: 2001

In this work we present new results of investigation of PbZr_0.235Ti0.765O_{3 (PTZ) films deposited onto Si/SiO}2/adhesion layer/(111) Pt substrate by RF sputtering. Optical constants of PZT films, refraction index depth profile and polarization profile were determined.
Trvalý link: http://hdl.handle.net/11104/0031392