0133126 - FZU-D 20000500 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Čerňanský, Marian
Restortion and processing of physical profiles from measured data.
Defect and Microstructure Analysis by Diffraction. New York: Int. Union of Crystallography, Oxford University Press, 1999 - (Snyder, R.; Fiala, J.; Bunge, H.), s. 613-646. ISBN 019-850-1897.
[Saiz strain "95"-X-Ray Powder Diffusion Analysis of Real Structure of Mater International Conference. Liptovský Mikuláš (SR), 21.08.1995-25.08.1995]
Grant CEP: GA ČR GA202/96/1685
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

State of the art evolution techniques for restorting (deconvolution of) physical patterns from the measured diffraction profiles, background subtraction, smoothing and interpolation, Fourier techniques, iterative solutions of integral equations, inverse filtering, regularisation and maximum entropy methods, maximum likelihood and Bayesian methods are discussed in detail.
Trvalý link: http://hdl.handle.net/11104/0031113