0131885 - FZU-D 980323 RIV US eng J - Článek v odborném periodiku
Tomasiunas, R. - Pelant, Ivan - Kočka, Jan - Knápek, Petr - Lévy, R. - Grun, J. B. - Honerlage, B.
Carrier diffusion in porous silicon studied by transient laser-induced grating spectroscopy.
Journal of Applied Physics. Roč. 79, - (1996), s. 2481-2486. ISSN 0021-8979. E-ISSN 1089-7550
Grant CEP: GA AV ČR IAA1010528; GA ČR GA202/95/1445
Grant ostatní: CT(XX) 27839
Impakt faktor: 1.812, rok: 1996
Trvalý link: http://hdl.handle.net/11104/0029928