0131627 - FZU-D 980097 RIV GB eng J - Článek v odborném periodiku
Zemek, Josef - Hucek, Stanislav - Jablonski, A. - Tilinin, I. S. - Bose, S. M. (ed.)
Escape probability of s-photoelectrons leaving aluminium and copper oxides.
Surface and Interface Analysis. Roč. 26, - (1998), s. 182-187. ISSN 0142-2421. E-ISSN 1096-9918
Grant CEP: GA ČR GA202/95/0032
Grant ostatní: GA UK(CZ) 33; KBN(PL) 2PO3B:009 10
Impakt faktor: 1.561, rok: 1998
Trvalý link: http://hdl.handle.net/11104/0029685