0028677 - FZÚ 2006 RIV NL eng J - Článek v odborném periodiku
Lorusso, A. - Belloni, F. - Doria, D. - Nassisi, V. - Wolowski, J. - Badziak, J. - Parys, P. - Krása, Josef - Láska, Leoš - Boody, F. P. - Torrisi, L. - Mezzasalma, A. - Picciotto, A. - Gammino, S. - Calcagnile, L. - Quarta, G. - Bleiner, D.
Modification of materials by high energy plasma ions.
[Modifikace materiálů ionty velkých energiích emitovaných z laserem generovaného plazmatu.]
Nuclear Instruments & Methods in Physics Research Section B. Roč. 240, - (2005), s. 229-233. ISSN 0168-583X. E-ISSN 1872-9584
Grant ostatní: EU(XE) HIPRI-1999-CT-00053/PALS/05; European Community program IHP(XE) HPMT-CT-2001-0263
Výzkumný záměr: CEZ:AV0Z10100523
Klíčová slova: laser-produced plasma * ion diagnostic measurements * implantation of laser-produced ions
Kód oboru RIV: BH - Optika, masery a lasery
Impakt faktor: 1.181, rok: 2005

The high-power iodine laser of the Prague Asterix Laser System (PALS), emitting radiation at 438 nm wavelength, 400 ps pulse duration and about 250 Jmaximum pulse energy, was employed to irradiate in vacuum a germanium target. The amount, the energy and the charge state of the ions emitted from the laser-produced plasma are analyzed by time-of-flight measurements performed with the use of ion collectors (ICs) and an electrostatic ion energy analyzer (IEA). Energetic Ge ions emitted from the laser-produced plasma were directly implanted into C substrates placed at 30 cm distance from the target and 30^o angle with respect to the normal to the target surface. The implantation depths and implanted doses were analyzed by two different techniques: the Rutherford backscattering spectrometry (RBS) and the laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS

Laserovými pulsy o energii 250 J generovanými laserovým systém PALS byly produkovány vysoce nabité Ge ionty, které byly implantovány do uhlíkových substrátů. Pomocí hloubkového profilu byla stanovena energie implantovaných iontů. Ten byl měřen dvěma metodami: RBS a hmotovou spektrometrií laserem ablaovaného povrchu substrátu.
Trvalý link: http://hdl.handle.net/11104/0118596